The 3rd International Conference on Metrology - November 14-16, 2006

Organizing Committees

International

Dr. Ilya Kuselman, IMS, Israel - Chairman
Dr. Laurie Besley, NMIA, Australia
Mr. Kim Carneiro, DFM, Denmark
Dr. Stephen Carpenter, NIST, USA
Mr. Gordon Clark, NPL, UK
Prof. Paul De Bievre, ACQUAL, Belgium
Dr. Ed W.B. de Leer, NMI, The Netherlands
Dr. Luc Erard, LNE, France
Dr. Robert Kaarls, CIPM, The Netherlands
Prof. Yuri Karpov, GIREDMET, Russia
Dr. Tamas Kemeny, IMEKO, Hungary
Dr. Willie E. May, NIST, USA
Mr. Charlie Motzko, NCSLI, USA
Dr. Yoshito Mitani Nakanishi, CENAM, Mexico
Mrs. Vera Poncano, IPT, Brazil
Prof. H?seyin Ugur, TUYAP Technology, Turkey
Prof. Andrew Wallard, BIPM, France

Israeli

Mr. Claude Apfeldorfer, INPL
Dr. Joe Brenner, Consultant
Dr. Naphtali Brodsky, Oil Refineries
Mr. Grisha Deitch, Ministry of Industry, Trade and Labor
Dr. Orna Dreazen, ISRAC
Prof. Eli Grushka, Hebrew University
Mr. Teddy Hoffman, SII
Dr. Henry Horwitz, ISAS
Dr. Berta Iosefzon, TEVA
Ms. Daniela Kruh, RAFAEL
Mr. Ilan Landesman, MABA
Dr. Alex Lepek, Newton Metrology
Prof. Ovadia Lev, Hebrew University
Dr. Alex Weisman, ChemAgis